KSPB Semiconductor Strain Gages

KSPB Semiconductor Strain Gages

These semiconductor strain gages have stable characteristics and can be used for standard stress measurement and as sensors (transducers). F2-type semiconductor strain gage uses an N2 element to form a half bridge and perform self temperature compensation, making it suitable for use with standard steel material.

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Description

Major Properties
Materials Resistive element 1-element: P type Si
2-element: P type Si and N type Si (2-element structure)
Materials Base Polyimide
Operating temperature in combination with major adhesives after curing (°C) CC-33A: -50 to 120ºC
EP-340: -50 to 150ºC
Operating temperature in combination with major leadwire cables (°C) –
Self-temperature-compensation (°C) 1-element: –
2-element: 20 to 50
Applicable linear expansion coefficients (×10-6/℃) 1-element: –
2-element: 11
Strain limits at normal temp. (approx. %) 1-element: 0.3
2-element: 0.15
Fatigue lives at normal temp. (times) 2 x 106 (±1000 μm/m)
How to order

*Silver-covered copper wires 25 mm long

*4 gages/pkg unless otherwise specified.