KSNB Self-temperature-compensation Semiconductor Strain Gages

These self-temperature-compensating semiconductor strain gages are designed to minimize the effect of temperature changes by controlling the temperature coefficient of resistance of their material to match the linear expansion coefficient of the material being measured (Excluding type E5). These use an N-type silicon as the resistive element.

Description

Major Properties

Materials Resistive element	N type Si
Materials Base	Polyimide
Operating temperature in combination with major adhesives after curing (°C)	EP-340: -50 to 150ºC CC-33A: -50 to 120ºC CC-36: -30 to 100ºC EP-17: -50 to 150ºC (for E5)
Operating temperature in combination with major leadwire cables (°C)	Silver-covered copper wires: -50 to 150ºC Oxygen-free tin-plated copper wires: -50 to 150ºC
Self-temperature-compensation (°C)	20 to 50ºC
Applicable linear expansion coefficients (×10-6/℃)	11, 16
Strain limits at normal temp. (approx. %)	0.1
Fatigue lives at normal temp. (times)	2×106 (Reference value, ±1000μm/m, normal temp.)

How to order

*Silver-covered copper wires 25 mm long (E5 type: Oxygen-free tin-plated copper wires 40 mm long)

*4 gages/pkg unless otherwise specified.